Defect tolerant probabilistic design paradigm for nanotechnologies

  title={Defect tolerant probabilistic design paradigm for nanotechnologies},
  author={Margarida F. Jacome and Chen He and Gustavo de Veciana and Stephen Bijansky},
  journal={Proceedings. 41st Design Automation Conference, 2004.},
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the tremendous increase in device density of nanoelectronics will be accompanied by a substantial increase in hard and soft faults, posing a major challenge to current design methodologies and tools. In this paper we propose a novel probabilistic design paradigm for defective but reconfigurable nanofabrics. The new design goal… CONTINUE READING
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