Defect tolerance in diode, FET, and four-terminal switch based nano-crossbar arrays


In this paper, defect tolerance performance of switching nano-crossbar arrays is extensively studied. Three types of nanoarrays where each crosspoint behaves as a diode, FET, and four-terminal switch, are considered. For each crosspoint, both stuck-open and stuck-closed defect probabilities are independently taken into consideration. A fast heuristic… (More)
DOI: 10.1109/NANOARCH.2015.7180591


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