Defect characterization for scaling of QCA devices [quantum dot cellular automata ]

@article{Huang2004DefectCF,
  title={Defect characterization for scaling of QCA devices [quantum dot cellular automata ]},
  author={Jing Huang and Mariam Momenzadeh and Mehdi Baradaran Tahoori and Fabrizio Lombardi},
  journal={19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.},
  year={2004},
  pages={30-38}
}
In this paper, we present the impact of scaling on defects that may arise in the manufacturing of quantum dot cellular automata (QCA) devices. This study shows how the sensitivity to manufacturing processing variations changes with device scaling. Scaling in QCA technology is related to cell dimension/size and cell-to-cell spacing within a Cartesian layout. Extensive simulation results on scaling of QCA devices, such as the majority voter, the inverter and the binary wire, are provided to show… CONTINUE READING
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