Defect-centric perspective of combined BTI and RTN time-dependent variability

Abstract

This paper describes the implications of time-dependent threshold voltage variability, induced by Bias Temperature Instability (BTI) and Random Telegraph Noise (RTN), on the reliability and performance of advanced technology nodes. Investigation of time-dependent variability at the individual trap level, e.g. in production environments, is not feasible with… (More)

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