Defect-based analog fault coverage analysis using mixed-mode fault simulation

  title={Defect-based analog fault coverage analysis using mixed-mode fault simulation},
  author={Joonsung Parky and Srinadh Madhavapeddiz and Alessandro Paglieri and Chris Barrz and Jacob A. Abrahamy},
  journal={2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop},
A fault coverage analysis has become an important tool to evaluate the testability of developing circuits and to come up with an effective test plan. However, the fault coverage analysis of analog circuits has not gained much attention due to the long fault simulation time and the absence of widely accepted fault models. This paper presents an efficient framework for the analog fault coverage analysis to provide repeatable and predictable analog test metrics. The presented method uses a defect… CONTINUE READING
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