Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection

@article{Li2011DefectII,
  title={Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection},
  author={Wei-Chen Li and Du-ming Tsai},
  journal={IEEE Transactions on Industrial Informatics},
  year={2011},
  volume={7},
  pages={136-147}
}
In this paper, we propose a Hough transform-based method to identify low-contrast defects in unevenly illuminated images, and especially focus on the inspection of mura defects in liquid crystal display (LCD) panels. The proposed method works on 1-D gray-level profiles in the horizontal and vertical directions of the surface image. A point distinctly deviated from the ideal line of a profile can be identified as a defect one. A 1-D gray-level profile in the unevenly illuminated image results in… CONTINUE READING
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