Deep sub-Ångstrom imaging of 2D materials with a high dynamic range detector

@article{Jiang2018DeepSI,
  title={Deep sub-{\AA}ngstrom imaging of 2D materials with a high dynamic range detector},
  author={Yi Jiang and Zhen Chen and Yimo Han and Pratiti Deb and Hui Gao and Saien Xie and Prafull Purohit and Mark Tate and Jiwoong Park and Sol M. Gruner and Veit Elser and David A. Muller},
  journal={arXiv: Materials Science},
  year={2018}
}
Aberration-corrected optics have made electron microscopy at atomic-resolution a widespread and often essential tool for nanocharacterization. Image resolution is dominated by beam energy and the numerical aperture of the lens ({\alpha}), with state-of-the-art reaching ~0.47 {\AA} at 300 keV. Two-dimensional materials are imaged at lower beam energies to avoid knock-on damage, limiting spatial resolution to ~1 {\AA}. Here, by combining a new electron microscope pixel array detector with the… 

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