Data visualization in a fast data acquisition system for long-term reliability tests of microelectronic interconnections

@article{Zawierta2008DataVI,
  title={Data visualization in a fast data acquisition system for long-term reliability tests of microelectronic interconnections},
  author={Rafal Zawierta and P. Matkowski and Klaus Urbanski and Jan Felba},
  journal={2008 2nd Electronics System-Integration Technology Conference},
  year={2008},
  pages={481-484}
}
  • Rafal Zawierta, P. Matkowski, +1 author Jan Felba
  • Published in
    2nd Electronics System…
    2008
  • Computer Science
  • In modern electronics one of the most important target is to make reliability tests shorter and more effective. To solve that problem, the novel fast data acquisition system was developed. It uses fast FPGA modules, a microcontroller for fast-response feedback and FPGA control as well as transmission of the data to PC over Ethernet protocol. Single test lasts for many days and produces large amount of data. It is necessary to acquire, store and visualize data in efficient way. There is no… CONTINUE READING

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