Data-reduction procedure for correction of geometric factors in the analysis of specular X-ray reflectivity of small samples

  title={Data-reduction procedure for correction of geometric factors in the analysis of specular X-ray reflectivity of small samples},
  author={Arijeet Das and Shreyashkar Dev Singh and R. J. Choudhari and S K Rai and Tapas Ganguli},
  journal={Journal of Applied Crystallography},
For small samples, the modification of the X-ray reflectivity (XRR) profile by the geometric factors due to the profile and size of the beam and the size of the sample is significant. These geometric factors extend the spill-over angle, which is often greater than the critical angle for small samples. To separate the geometric factors, it is necessary to know the spill-over angle. Since the geometric factors are smoothly varying functions and extend beyond the critical angle, it is impossible… 
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  • Rev. 95, 359–369 . Romanov, V. P., Ulyanov, S. V., Uzdin, V. M., Nowak, G., Shokuie, K. and Zabel, H. (2010). Phys. Rev. B 82, 165416. Salah, F., Harzallah, B. and Lee, A.van der (2007). Journal of Applied Crystallography, 40,(813-819).
  • 1954
CEMES, Toulouse, France
  • Gbaud, A., Vingaud, G., and Sinha, S. K. (1993). Acta. Cryst, A49, 642-648. Nevot, L., and Croce, P. (1980). Rev. Phys. Appl., 15, 761–779 .
  • 2006