Data-reduction procedure for correction of geometric factors in the analysis of specular X-ray reflectivity of small samples

@article{Das2018DatareductionPF,
  title={Data-reduction procedure for correction of geometric factors in the analysis of specular X-ray reflectivity of small samples},
  author={Arijeet Das and Shreyashkar Dev Singh and R. J. Choudhari and S K Rai and Tapas Ganguli},
  journal={Journal of Applied Crystallography},
  year={2018}
}
For small samples, the modification of the X-ray reflectivity (XRR) profile by the geometric factors due to the profile and size of the beam and the size of the sample is significant. These geometric factors extend the spill-over angle, which is often greater than the critical angle for small samples. To separate the geometric factors, it is necessary to know the spill-over angle. Since the geometric factors are smoothly varying functions and extend beyond the critical angle, it is impossible… 
4 Citations
REFLEX: a program for the analysis of specular X-ray and neutron reflectivity data
The use of X-ray and neutron reflectivity has been generalized worldwide for scientists who want to determine specific physical properties (such as electron-density profile, scattering-length
Mapping unit-cell thickness variations in thin films by post-deposition reflection high-energy electron diffraction
Reflection high-energy electron diffraction is a widely used tool to study the growth dynamics of thin films, in situ and operando. Here it is applied after deposition, revealing that the
Probing layered structure of Inconel 625 coatings prepared by magnetron sputtering
Abstract Coating/substrate interface and oxide layers present in Inconel 625 film may cause significant impacts on its corrosion behavior. However, layered structure of Inconel 625 coatings remains

References

SHOWING 1-10 OF 11 REFERENCES
The correction of geometrical factors in the analysis of X-ray reflectivity
X-ray reflectivity is a powerful technique to study electron density profiles in the direction normal to the surface of a fiat sample. As usual in scattering experiments, where the phase information
Surface Studies of Solids by Total Reflection of X-Rays
Analysis of the shape of the curve of reflected x-ray intensity vs glancing angle in the region of total reflection provides a new method of studying certain structural properties of the mirror
Data reduction practice in X-ray reflectometry
Data reduction practice in X-ray reflectometry is described. The several approaches for applying certain corrections, such as background subtraction, geometrical effects and normalization, are
SURFACE AND INTERFACE TOPOGRAPHY OF AMORPHOUS SIO2/CRYSTALLINE SI(100) STUDIED BY X-RAY DIFFRACTION
Several samples of a-SiO2/c-Si(100) with different oxide layer thicknesses and different silicon surface qualities were examined by X-ray diffraction. The layer thickness as well as the surface
Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates
La theorie presentee permet d'obtenir une formulation explicite de l'influence des rugosites ainsi que des variations locales de constante dielectrique n2 (dues par exemple a une modification de
Phys
  • Rev. 95, 359–369 . Romanov, V. P., Ulyanov, S. V., Uzdin, V. M., Nowak, G., Shokuie, K. and Zabel, H. (2010). Phys. Rev. B 82, 165416. Salah, F., Harzallah, B. and Lee, A.van der (2007). Journal of Applied Crystallography, 40,(813-819).
  • 1954
CEMES, Toulouse, France
  • Gbaud, A., Vingaud, G., and Sinha, S. K. (1993). Acta. Cryst, A49, 642-648. Nevot, L., and Croce, P. (1980). Rev. Phys. Appl., 15, 761–779 .
  • 2006
...
1
2
...