Dark current and single photon detection by 1550 nm avalanche photodiodes: dead time corrected probability distributions and entropy rates.
@article{Menkart2022DarkCA, title={Dark current and single photon detection by 1550 nm avalanche photodiodes: dead time corrected probability distributions and entropy rates.}, author={Nicole Menkart and Joseph D. Hart and Thomas Murphy and Rajarshi Roy}, journal={Optics express}, year={2022}, volume={30 22}, pages={ 39431-39444 } }
Single photon detectors have dark count rates that depend strongly on the bias level for detector operation. In the case of weak light sources such as novel lasers or single-photon emitters, the rate of counts due to the light source can be comparable to that of the detector dark counts. In such cases, a characterization of the statistical properties of the dark counts is necessary. The dark counts are often assumed to follow a Poisson process that is statistically independent of the incidentβ¦Β
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