Dangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis

@article{Consentino2013DangerousEI,
  title={Dangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis},
  author={Giuseppe Consentino and M. Laudani and Giuseppe Privitera and Aldo Parlato and Nicol{\`o} Marchese and Elio Tomarchio and Calogero Pace and Cinzia Giordano and Michael A. Mazzeo and J. L. Hernandez Ambato},
  journal={AEIT Annual Conference 2013},
  year={2013},
  pages={1-6}
}
This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when they are biased during their normal working conditions especially in inverters for photovoltaic applications. After a brief review of power MOSFETs failure phenomena caused by neutron irradiation (with emphasis on so called “Single Event Effects” (SEE)), the results of an accelerated test performed with the Am-Be source at the University of Palermo are discussed.