DRAM technology perspective for gigabit era

  title={DRAM technology perspective for gigabit era},
  author={Kinam Kim and C. Hwang and Jong Gil Lee},
  journal={IEEE Transactions on Electron Devices},
Many challenges emerge as the DRAM enters into a generation of the gigabit density era. Most of the challenges come from the shrink technology which scales down minimum feature size by a factor of 0.84 per year. The need for higher performance to narrow the bandwidth mismatch between fast processors and slower memories and lower power consumption drives the DRAM technology toward smaller cell size, faster memory cell operation, less power consumption, and longer data retention times. In… Expand
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  • S. Lee, S.H. Hong, +6 authors Kinam Kim
  • Engineering
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  • 2003
As the technology node of DRAM goes below 100 nm, the dimensional scaling of the devices greatly influences the major parameters that determine the performance of DRAM. Especially, the reduction ofExpand
Merged DRAM-logic in the year 2001
  • P. Diodato, L. Noda, +10 authors M. Nakamae
  • Computer Science
  • Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236)
  • 1998
The research reported here will explain the joint technology development of two corporations working on a merged memory-logic technology in terms of memory cell design comparisons, transistor and capacitor specifications, process technology tradeoffs, and circuit simulations. Expand
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  • Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005.
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For the first time, we developed successfully the 512Mb DRAMs using step-gated-asymmetric (STAR) cell transistors with 90nm feature size. The STAR with step recessed channel depth of 40nm exhibitsExpand
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  • IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.
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Whether memory technologies can continue advances beyond sub-50nm node especially for DRAM and NAND flash memories is discussed, and details of technology solutions are introduced and its manufacturability is examined. Expand


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