DISPERSION FORCES AND HAMAKER CONSTANTS FOR INTERGRANULAR FILMS IN SILICON NITRIDE FROM SPATIALLY RESOLVED-VALENCE ELECTRON ENERGY LOSS SPECTRUM IMAGING

@inproceedings{french1998DISPERSIONFA,
  title={DISPERSION FORCES AND HAMAKER CONSTANTS FOR INTERGRANULAR FILMS IN SILICON NITRIDE FROM SPATIALLY RESOLVED-VALENCE ELECTRON ENERGY LOSS SPECTRUM IMAGING},
  author={roger. h. french and H. MU{\`E} and Donald JL Jones and Gerard Duscher and Raymond J. C. Cannon},
  year={1998}
}
ÐThe van der Waals (vdW) dispersion forces represent one of the fundamental long range interfacial and surface forces in materials. The dispersion forces, for a set of materials in close proximity, arise from the electronic structure of the materials wherein the electrons in interatomic bonds acting as oscillating dipoles exhibit an attractive interaction energy. These vdW dispersion forces, represented by a proportionality constant, the full spectral Hamaker constant (A), can be calculated… CONTINUE READING
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Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada • 2000
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