DFT and Probabilistic Testability Analysis at RTL

  title={DFT and Probabilistic Testability Analysis at RTL},
  author={Jos{\'e} M. Fernandes and Marcelino B. Santos and Arlindo L. Oliveira and Jo{\~a}o Paulo Cacho Teixeira},
  journal={2006 IEEE International High Level Design Validation and Test Workshop},
This work presents probabilistic methods for testability analysis at RTL and their use to guide DFT techniques like partial-scan and TPI. Controllability is analyzed using three different approaches, an exact one, an approximated one that ignores the correlation between state variables and a third that only takes into account correlations within pre-defined groups that are formed based on an originally proposed heuristic that uses RTL information. These controllability analysis methods are… CONTINUE READING
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