DETERMINATION OF AVERAGE PORE DIAMETER OF SiO 2 XEROGELS BY SMALL ANGLE X-RA Y SCATTERING

@inproceedings{Zhihong2000DETERMINATIONOA,
  title={DETERMINATION OF AVERAGE PORE DIAMETER OF SiO 2 XEROGELS BY SMALL ANGLE X-RA Y SCATTERING},
  author={Li Zhihong and Sun Ji-hong and Danyi Wu and S. H. Yuhan and Liu Yun Yi and Sheng Wenjun and Dong Bao-zhong},
  year={2000}
}
Small angle X-ray scattering (SAXS) with synchrotron radiation as X-ray source h as been used to study the structure of SiO 2 xerogels prepared by sol-gel pr ocess. All SAXS profiles in this paper deviate from Porod's law and show negativ e or positive deviation. In order to obtain the information of pore in SiO 2 xerogels, we have proposed the corresponding methods to correct the negat ive and positive deviations from Porod's law. Then, the average pore diameter of SiO 2 xerogels is determined… CONTINUE READING

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