Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays

Abstract

We conduct a thorough investigation of random telegraph noise (RTN) dependence on program/erase and read/bake conditions in state-of-the-art 1X and 2X Flash NAND technologies. We demonstrate that RTN depends only on the cycle number and not on the program level or cycling pattern. Moreover, if the cumulative distribution of RTN is considered, a negligible… (More)
DOI: 10.1109/IRPS.2015.7112812

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