Current calculation on VLSI signal interconnects

  title={Current calculation on VLSI signal interconnects},
  author={Muzhou Shao and Youxin Gao and Li-Pen Yuan and Hung-Ming Chen and Martin D. F. Wong},
  journal={Sixth international symposium on quality electronic design (isqed'05)},
With IC technology scaling down to nanometer sizes, the higher working frequency and smaller geometry drive the reliability of signal interconnects to be a critical challenge in VLSI design. Post-layout reliability verification is an effective solution to this challenge. However, the implementation of a full-chip verification on signal electromigration requires a huge number of interconnect current calculations. The dynamic current calculation methods established on time domain circuit… CONTINUE READING


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