Current Mode Logic Testing of XOR / XNOR Circuit : A Case Study

@inproceedings{Fouad2013CurrentML,
  title={Current Mode Logic Testing of XOR / XNOR Circuit : A Case Study},
  author={Mona A. Fouad and Hassanein H. Amer and Ahmed H. Madian and Mohamed B. Abdelhalim},
  year={2013}
}
This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for testing CML gates. It is then proved that switching the order in which inputs are applied to a gate will affect the minimum test set; this is not the case in conventional voltage mode gates. Both the circuit output and its inverse have to be monitored to reduce the size of the test… CONTINUE READING

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