Crystallization Behavior of the AgInSbTe Film

Abstract

The sputtered films of Ag4 3In6.2Te30.5Sb60 nominal composition subjected to the various laser powers treatment from the initializer are analyzed. The degree of crystallization of this sputtered film is significantly dependent on the laser powers. Extended X-ray absorption fine structure (EXAFS) spectra indicate that, before initialization, the bonding… (More)

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