Cross-Layer Approaches for an Aging-Aware Design Space Exploration for Microprocessors

  title={Cross-Layer Approaches for an Aging-Aware Design Space Exploration for Microprocessors},
  author={Fabian Oboril and Mehdi Baradaran Tahoori},
With the continuous scaling of CMOS technologies, maintaining the microprocessor reliability becomes a major design challenge. In particular, accelerated transistor aging is a serious reliability concern, as it considerably reduces the operational system lifetime. To address this issue, in this work cross-layer solutions for aging modeling, simulation and mitigation are proposed, to be able to co-optimize reliability together with the traditional design constraints such as power, performance… CONTINUE READING


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