Cross Kelvin force microscopy and conductive atomic force microscopy studies of organic bulk heterojunction blends for local morphology and electrical behavior analysis

@article{VilleneuveFaure2015CrossKF,
  title={Cross Kelvin force microscopy and conductive atomic force microscopy studies of organic bulk heterojunction blends for local morphology and electrical behavior analysis},
  author={C. Villeneuve-Faure and D. Borgne and E. Bedel-Pereira and K. I. M. Chane-Ching and D. Hern{\'a}ndez-Maldonado and I. S{\'e}guy},
  journal={Journal of Applied Physics},
  year={2015},
  volume={117},
  pages={055501}
}
Bulk Heterojunction (BHJ) organic photovoltaic devices performances depend on the relative organization and physical properties of the electron-donor and -acceptor materials. In this paper, BHJs of poly(3-hexyl-thiophene) (P3HT) associated with an electron acceptor material, 1-(3-methoxycarbonyl)-propyl-1-phenyl[6,6]C6 (PCBM) or [Ni(4dodpedt)2], are studied in terms of morphology, ordering, and electrical properties. First, comparison between the two BHJs performed by Atomic Force Microscopy… Expand
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Time-resolved electrostatic force microscopy of polymer solar cells
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