Critical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction.

@article{Jungk2005CriticalAO,
  title={Critical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction.},
  author={Tobias Jungk and T Walther and Werner Mader},
  journal={Ultramicroscopy},
  year={2005},
  volume={104 3-4},
  pages={206-19}
}
The technique of fluctuation electron microscopy (FEM) is applied to thin films of amorphous germanium and of polycrystalline gold in a transmission electron microscope. Even though the method was introduced as a tool for quantitative analysis of structural fluctuations in amorphous materials, the basic principles are applicable to any disordered specimen… CONTINUE READING