Criteria for approximating a layer in three-dimensional thermal models of multilayer microelectronics

@article{Creel1994CriteriaFA,
  title={Criteria for approximating a layer in three-dimensional thermal models of multilayer microelectronics},
  author={Kenneth Creel and David J. Nelson},
  journal={Proceedings of 1994 4th Intersociety Conference on Thermal Phenomena in Electronic Systems (I-THERM)},
  year={1994},
  pages={207-213}
}
This paper seeks to determine instances when three-dimensional thermal model can be simplified, yielding lower processing times but still obtain accurate results. Specifically, heat transfer in multilayer microelectronics is examined, with heat loss both to a heat sink and to the surroundings. The effect of removing a layer in the model is studied, documenting the relationship between layer thickness and conductivity and the error introduced by removing the layer.<<ETX>> 

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