Cr metal thin film memory

Augustin J. Hong, Jiyoung Kim, Kyoungwhan Kim, Yong Wang, Faxian Xiu, Jaeseok Jeon, Jemin Park, Iris Rauda, Li-Min Chen, Yang Yang, Sarah Tolbert, Jin Zou, and Kang L. Wang IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, USA Device Solution Business, Samsung Electronics, Co., Ltd., Kyunggi Do 449-711, South Korea Department of Electrical… CONTINUE READING