Coverage metrics for verification of concurrent SystemC designs using mutation testing

@article{Sen2010CoverageMF,
  title={Coverage metrics for verification of concurrent SystemC designs using mutation testing},
  author={Alper Sen and Magdy S. Abadir},
  journal={2010 IEEE International High Level Design Validation and Test Workshop (HLDVT)},
  year={2010},
  pages={75-81}
}
Design verification has grown to dominate the cost of electronic system design; however, designs continue to be released with latent bugs. A verification test suite developed for a sequential program is not adequate for a concurrent program. A major problem with design verification of concurrent systems is the lack of good coverage metrics. Coverage metrics are heuristic measures of the exhaustiveness of a test suite. High coverage, in general, implies fewer bugs. SystemC is the most popular… CONTINUE READING
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