Cost-effective radiation hardening technique for combinational logic

@article{Zhou2004CosteffectiveRH,
  title={Cost-effective radiation hardening technique for combinational logic},
  author={Quming Zhou and Kartik Mohanram},
  journal={IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.},
  year={2004},
  pages={100-106}
}
A radiation hardening technique for combinational logic circuits is described. The key idea is to exploit the asymmetric logical masking probabilities of gates, hardening gates that have the lowest logical masking probability to achieve cost-effective tradeoffs between overhead and soft error failure rate reduction. The technique, which decouples the physical from the logical aspects of soft error susceptibility of a gate, uses a gate (transistor) sizing technique that is both efficient and… CONTINUE READING
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