Correspondence between noisy sample space reducing process and records statistics in correlated random events

Abstract

We study survival time statistics in a noisy sample space reducing (SSR) process. Our simulations suggest that both mean and standard deviation scale as ∼ N/N, where N is the system size and λ is a tunable parameter that characterizes the process. The survival time distribution has the form PN (τ) ∼ N−θJ(τ/Nθ), where J is a universal scaling function and… (More)

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