• Corpus ID: 119225626

Correlating 3D atomic defects and electronic properties of 2D materials with picometer precision

@article{Tian2019Correlating3A,
  title={Correlating 3D atomic defects and electronic properties of 2D materials with picometer precision},
  author={Xuezeng Tian and Dennis S. Kim and Shi-ze Yang and Christopher J. Ciccarino and Yongji Gong and Yongsoo Yang and Yao Yang and Blake Duschatko and Yakun Yuan and Pulickel M. Ajayan and Juan Carlos Idrobo and Prineha Narang and Jianwei Miao},
  journal={arXiv: Materials Science},
  year={2019}
}
The exceptional electronic, optical and chemical properties of two-dimensional materials strongly depend on the 3D atomic structure and crystal defects. Using Re-doped MoS2 as a model, here we develop scanning atomic electron tomography (sAET) to determine the 3D atomic positions and crystal defects such as dopants, vacancies and ripples with a precision down to 4 picometers. We measure the 3D bond distortion and local strain tensor induced by single dopants for the first time. By directly… 

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