Corrections for surface X-ray diffraction measurements using the Z-axis geometry: finite size effects in direct and reciprocal space

@inproceedings{Robach2000CorrectionsFS,
  title={Corrections for surface X-ray diffraction measurements using the Z-axis geometry: finite size effects in direct and reciprocal space},
  author={Odile Robach and Yves Garreau and K. A{\"i}d and M. B. V{\'e}ron-Jolliot},
  year={2000}
}
X-ray diffraction data have to be corrected by geometrical correction factors prior to any quantitative analysis. Here the case of grazing incidence X-ray diffraction measurements is considered, including the case of high exit angles. First, an approach taking into account the evolution of the diffracting area during an ω scan is presented. From the calculation of the effective part of the sample surface that participates in the diffraction phenomena at each step of the scan, a more accurate… CONTINUE READING