Convenient preparation of high-quality specimens for annealing experiments in the transmission electron microscope.

Abstract

A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to… (More)
DOI: 10.1017/S1431927614013476

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Citations per Year

Citation Velocity: 12

Averaging 12 citations per year over the last 3 years.

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