Contrast mechanisms and image formation in helium ion microscopy.

@article{Bell2009ContrastMA,
  title={Contrast mechanisms and image formation in helium ion microscopy.},
  author={David C. Bell},
  journal={Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada},
  year={2009},
  volume={15 2},
  pages={147-53}
}
The helium ion microscope is a unique imaging instrument. Based on an atomic level imaging system using the principle of field ion microscopy, the helium ion source has been shown to be incredibly stable and reliable, itself a remarkable engineering feat. Here we show that the image contrast is fundamentally different to other microscopes such as the scanning electron microscope (SEM), although showing many operational similarities due to the physical ion interaction mechanisms with the sample… CONTINUE READING

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