Continuous capacitance-voltage spectroscopy mapping for scanning microwave microscopy.

@article{Mrtelmaier2014ContinuousCS,
  title={Continuous capacitance-voltage spectroscopy mapping for scanning microwave microscopy.},
  author={Manuel A. M{\"o}rtelmaier and H P Huber and Christian Rankl and F. Kienberger},
  journal={Ultramicroscopy},
  year={2014},
  volume={136},
  pages={67-72}
}
A new method, scanning sawtooth capacitance spectroscopy (SSCS), is proposed to measure a map of capacitance/voltage curves (C-V) by applying a low frequency voltage sawtooth signal (20-100 Hz) to the AFM tip while scanning. For this a scanning microwave microscope (SMM) is used to acquire calibrated capacitance data in the high frequency range of 1-20 GHz. While the capacitance is acquired pixel by pixel, the applied voltage signal is recorded as well, and each pixel of the capacitance is… CONTINUE READING
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