Contact mode imaging using AFM probes with exchangeable tips

@article{Mrinalini2016ContactMI,
  title={Contact mode imaging using AFM probes with exchangeable tips},
  author={R. Sri Muthu Mrinalini and G. R. Jayanth},
  journal={2016 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)},
  year={2016},
  pages={1-6}
}
This paper presents the design and evaluation of an Atomic Force Microscope (AFM) probe with exchangeable tips. It can be employed to replace tips worn out during imaging, or to exchange tips during multi-step nano-metrology and manipulation tasks. The probe employs a liquid meniscus-based micro-gripper at its end to enable exchange of tips. The design of the gripper and tip-supply station are discussed and the stiffness of the gripper is analyzed. Subsequently, the system is fabricated and… CONTINUE READING

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