Concurrent polarization retrieval Method in multi- heterodyne scanning near-field optical Microscopy

Abstract

Scanning near-field optical microscopy (SNOM) is a popular tool to overcome the diffraction limit for the investigation of subwavelength-scale optical structures. For nearly 30 years, various configurations have been implemented to characterize the interactions of the electromagnetic field with nanostructures in the near field. An accurate understanding of… (More)

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