Complexity of sequential ATPG

  title={Complexity of sequential ATPG},
  author={Thomas E. Marchok and Aiman H. El-Maleh and Wojciech Maly and Janusz Rajski},
The research reported in this paper was conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation (ATPG) algorithms, which can lead to extremely high test generation times. The retiming transformation is used as a mechanism to create two classes of circuits which present varying degrees of complexity for test generation. It was observed for three different sequential test generators that the increase in complexity of testing… CONTINUE READING
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