Complex refractive indices of thin films of secondary organic materials by spectroscopic ellipsometry from 220 to 1200 nm.

@article{Liu2013ComplexRI,
  title={Complex refractive indices of thin films of secondary organic materials by spectroscopic ellipsometry from 220 to 1200 nm.},
  author={Pengfei Liu and Yue Zhang and Scot T Martin},
  journal={Environmental science & technology},
  year={2013},
  volume={47 23},
  pages={13594-601}
}
The complex refractive indices of three different types of secondary organic material (SOM) were obtained for 220 to 1200 nm using a variable angle spectroscopic ellipsometer. Aerosol particles were produced in a flow tube reactor by ozonolysis of volatile organic compounds, including the monoterpenes α-pinene and limonene and the aromatic catechol (benzene-1,2-diol). Optically reflective thin films of SOM were grown by electrostatic precipitation of the aerosol particles onto silicon… CONTINUE READING
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