Complementary Characterization of Cu(In,Ga)Se₂ Thin-Film Photovoltaic Cells Using Secondary Ion Mass Spectrometry, Auger Electron Spectroscopy, and Atom Probe Tomography.

@article{Jang2018ComplementaryCO,
  title={Complementary Characterization of Cu(In,Ga)Se₂ Thin-Film Photovoltaic Cells Using Secondary Ion Mass Spectrometry, Auger Electron Spectroscopy, and Atom Probe Tomography.},
  author={Yun Jung Jang and Jihye Lee and Jeung-hyun Jeong and Kang-Bong Lee and Donghwan Kim and Yeonhee Lee},
  journal={Journal of nanoscience and nanotechnology},
  year={2018},
  volume={18 5},
  pages={3548-3556}
}
To enhance the conversion performance of solar cells, a quantitative and depth-resolved elemental analysis of photovoltaic thin films is required. In this study, we determined the average concentration of the major elements (Cu, In, Ga, and Se) in fabricated Cu(In,Ga)Se2 (CIGS) thin films, using inductively coupled plasma atomic emission spectroscopy, X-ray… CONTINUE READING