Competing reversal mechanisms and edge roughness in thin micron-scale ferromagnetic ring elements

@article{Hayward2006CompetingRM,
  title={Competing reversal mechanisms and edge roughness in thin micron-scale ferromagnetic ring elements},
  author={T. Hayward and F. Van Belle and J. Bland},
  journal={INTERMAG 2006 - IEEE International Magnetics Conference},
  year={2006},
  pages={940-940}
}
The results of micromagnetic simulations which investigate the role of edge roughness in the switching behaviour of micrometer-scale permalloy rings is presented and show that the change in behaviour observed in thin elements can be explained by the effect the roughness has on the local spin dynamics of the ring.