Compendia of TID and SEE test results of integrated circuits

Abstract

Single event effects (SEE) and total ionizing dose (TID) data taken for existing and potential space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.

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Cite this paper

@article{Layton2004CompendiaOT, title={Compendia of TID and SEE test results of integrated circuits}, author={P . G . Layton and Geordie Williamson and Chanelle Gilbert and L. Longden and E. Patnaude and Charlotte Sloan}, journal={2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774)}, year={2004}, pages={6-9} }