Comparison of single-event upset generated by heavy ion and pulsed laser

Abstract

Single-event upset (SEU) is investigated using heavy ion and pulsed laser. The measured SEU cross sections of D and DICE flip-flops are compared. Measurement results indicate pulsed laser is capable of inducing similar SEU to those induced by heavy ion. 3D-TCAD simulation is performed to investigate the factors to impact pulsed laser induced SEU. Simulation… (More)
DOI: 10.1007/s11432-016-0346-1

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@article{Liang2016ComparisonOS, title={Comparison of single-event upset generated by heavy ion and pulsed laser}, author={Bin Liang and Ruiqiang Song and Jianwei Han and Yaqing Chi and Rui Chen and Chunmei Hu and Jianjun Chen and Yingqi Ma and Shipeng Shangguan}, journal={Science China Information Sciences}, year={2016}, volume={60}, pages={1-9} }