Comparison of scanning ion conductance microscopy with atomic force microscopy for cell imaging.

Abstract

We present the first direct comparison of scanning ion conductance microscopy (SICM) with atomic force microscopy (AFM) for cell imaging. By imaging the same fibroblast or myoblast cell with both technologies in series, we highlight their advantages and disadvantages with respect to cell imaging. The finite imaging force applied to the sample in AFM imaging… (More)
DOI: 10.1021/la103275y

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