Comparison of optimal performance at 300 keV of three direct electron detectors for use in low dose electron microscopy

@inproceedings{McMullan2014ComparisonOO,
  title={Comparison of optimal performance at 300 keV of three direct electron detectors for use in low dose electron microscopy},
  author={Gregory McMullan and A. R. Faruqi and Daniel Kofi Clare and Richard Henderson},
  booktitle={Ultramicroscopy},
  year={2014}
}
Low dose electron imaging applications such as electron cryo-microscopy are now benefitting from the improved performance and flexibility of recently introduced electron imaging detectors in which electrons are directly incident on backthinned CMOS sensors. There are currently three commercially available detectors of this type: the Direct Electron DE-20… CONTINUE READING