Comparison of Pinning Voltage Estimation Methods in Pinned Photodiode CMOS Image Sensors

@article{Pelamatti2016ComparisonOP,
  title={Comparison of Pinning Voltage Estimation Methods in Pinned Photodiode CMOS Image Sensors},
  author={Alice Pelamatti and Vincent Goiffon and Alexis de Ipanema Moreira and Pierre Magnan and Cedric Virmontois and Olivier Saint-P{\'e} and Michel Breart de Boisanger},
  journal={IEEE Journal of the Electron Devices Society},
  year={2016},
  volume={4},
  pages={99-108}
}
The pinning voltage is a key design parameter of pinned photodiode CMOS image sensors which significantly affects the device performances and which is often used by manufacturers to monitor production lines and for the optimization of technological processes. This paper presents a comparative study of pinning voltage estimation methods, which are based on both electrical measurements performed on isolated test structures (or on test structures arrays) and in-pixel measurements. It is shown… CONTINUE READING
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