Comparison and correlation of ESD HBM (human body model) obtained between TLPG, wafer-level, and package-level tests

Abstract

In this work, we have found that the TLPG (transmission line pulse generator) can be well correlated to the HBM by adding a parasitic series resistance obtained simply from the least squares error solution method or numerically from a simplified LEM (lumped element model) method. Also, experimental evidence suggests that the HBM is best described by the log… (More)

6 Figures and Tables

Cite this paper

@article{Lee2000ComparisonAC, title={Comparison and correlation of ESD HBM (human body model) obtained between TLPG, wafer-level, and package-level tests}, author={M. T. Lee and C. J. Liu and Chung-Chiang Lin and Jin-Tau Chou and H.T.H. Tang and Y. J. Chang and K. Y. Fu}, journal={Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)}, year={2000}, pages={105-110} }