Comparison and correlation of ESD HBM (human body model) obtained between TLPG, wafer-level, and package-level tests

@article{Lee2000ComparisonAC,
  title={Comparison and correlation of ESD HBM (human body model) obtained between TLPG, wafer-level, and package-level tests},
  author={M. T. Lee and C Liu and Chung-Chiang Lin and Jin-Tau Chou and H.T.H. Tang and Y. J. Chang and K. Y. Fu},
  journal={Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)},
  year={2000},
  pages={105-110}
}
  • M.T. Lee, C Liu, +4 authors K.Y. Fu
  • Published 2000 in
    Electrical Overstress/Electrostatic Discharge…
In this work, we have found that the TLPG (transmission line pulse generator) can be well correlated to the HBM by adding a parasitic series resistance obtained simply from the least squares error solution method or numerically from a simplified LEM (lumped element model) method. Also, experimental evidence suggests that the HBM is best described by the log normal distribution rather than the normal distribution. 
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