Comparative analysis of Sense Amplifiers for SRAM in 65nm CMOS technology

  title={Comparative analysis of Sense Amplifiers for SRAM in 65nm CMOS technology},
  author={Nidhi Chandoke and Neha Chitkara and Anuj Grover},
  journal={2015 IEEE International Conference on Electrical, Computer and Communication Technologies (ICECCT)},
A comparative analysis of four sense amplifiers for Static Random Access Memories (SRAMs) namely conventional current Sense Amplifier (CSA), Current Latched Sense Amplifier (SA), Clamped Bitline SA and Gated Diode SA is presented in 65 nm CMOS technology. Mismatches are introduced in the form of W/L variations, bitline capacitance variations, temperature variations and Vdd variations and their effect on the sense amplifier's sense offset and delay offset have been analysed and reported. In the… CONTINUE READING
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Showing 1-8 of 8 references

Diode Sense Amplifiers

  • Wing K. Luk, Robert H. Dennard, Gated
  • IEEE Transactions on Circuits and Systems,
  • 2005
3 Excerpts

Comparative study of different current mode sense amplifiers in submicron CMOS technology

  • A. Chrisanthopoulos, Y. Moisiadis, Y. Tsiatouhas, A. Arapoyanni
  • lEE Proc.­ Circuits Devices Syst.,
  • 2002
2 Excerpts

R.C.,"A High-speed Clamped Bit-line Current-mode Sense Amplifier

  • T. N. Blalock, Jaeger
  • IEEE J. Solid-State Circuits,
  • 1991

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