Combining the histogram method and the ultrafast segmented model identification of linearity errors algorithm for ADC linearity testing

Abstract

In this paper, we propose a novel method termed as the histogram and ultrafast segmented model identification of linearity errors (H-USMILE), in order to implement an efficient linearity test of ADCs. We use the standard histogram method with only a small number of test samples to obtain coarse INL results, along with the segmented non-parametric model of… (More)
DOI: 10.1109/ETS.2016.7519298

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