• DOI:10.1017/S143192761600787X
• Corpus ID: 4882243

Combining Non-Rigid Registration with Non-Local Principle Component Analysis for Atomic Resolution EDS Mapping

@article{Zhang2016CombiningNR,
  title={Combining Non-Rigid Registration with Non-Local Principle Component Analysis for Atomic Resolution EDS Mapping},
  author={Chenyu Zhang and Albert K. Oh and Andrew B. Yankovich and Thomas J. A. Slater and Sarah Haigh and Rebecca Willett and Paul M. Voyles},
  journal={Microscopy and Microanalysis},
  year={2016},
  volume={22},
  pages={1406 - 1407}
}

• Chenyu Zhang, A. Oh, +4 authors P. Voyles
• Published 1 July 2016
• Materials Science
• Microscopy and Microanalysis

Chenyu Zhang, Albert Oh, Andrew Yankovich, Thomas Slater, Sarah Haigh, Rebecca Willett, Paul M. Voyles 1. Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA 2. Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA 3. Department of Physics, Chalmers University of Technology, Gothenburg, Sweden 4 School of Materials, University of Manchester, Manchester, M13 9PL, UK.