Combining Non-Rigid Registration with Non-Local Principle Component Analysis for Atomic Resolution EDS Mapping

@article{Zhang2016CombiningNR,
  title={Combining Non-Rigid Registration with Non-Local Principle Component Analysis for Atomic Resolution EDS Mapping},
  author={Chenyu Zhang and Albert K. Oh and Andrew B. Yankovich and Thomas J. A. Slater and Sarah Haigh and Rebecca Willett and Paul M. Voyles},
  journal={Microscopy and Microanalysis},
  year={2016},
  volume={22},
  pages={1406 - 1407}
}
Chenyu Zhang, Albert Oh, Andrew Yankovich, Thomas Slater, Sarah Haigh, Rebecca Willett, Paul M. Voyles 1. Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA 2. Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA 3. Department of Physics, Chalmers University of Technology, Gothenburg, Sweden 4 School of Materials, University of Manchester, Manchester, M13 9PL, UK. 

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This work was supported by the US Department of Energy, Basic Energy Sciences, under grant DE-FG02-08ER46547
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