Combining Deterministic and Genetic Approaches for Sequential Circuit Test Generation

@article{Rudnick1995CombiningDA,
  title={Combining Deterministic and Genetic Approaches for Sequential Circuit Test Generation},
  author={Elizabeth M. Rudnick and Janak H. Patel},
  journal={32nd Design Automation Conference},
  year={1995},
  pages={183-188}
}
A hybrid sequential circuit test generator is described which combines deterministic algorithms for fault excitation and propagation with genetic algorithms for state justification. Deterministic procedures for state justification are used if the genetic approach is unsuccessful, to allow for identification of untestable faults and to improve the fault coverage. High fault coverages were obtained for the ISCAS89 benchmark circuits and several additional circuits, and in many cases the results… CONTINUE READING
Highly Cited
This paper has 55 citations. REVIEW CITATIONS

4 Figures & Tables

Topics

Statistics

0510'97'99'01'03'05'07'09'11'13'15'17
Citations per Year

56 Citations

Semantic Scholar estimates that this publication has 56 citations based on the available data.

See our FAQ for additional information.