Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress

@article{Goel2015CombinedTG,
  title={Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress},
  author={Nilesh Goel and Tejas Naphade and Souvik Mahapatra},
  journal={2015 IEEE International Reliability Physics Symposium},
  year={2015},
  pages={4A.3.1-4A.3.7}
}
A transient trap occupancy model is proposed to determine the charged state of generated N<sub>IT</sub> in real time during successive stress (pulse ON) and recovery (pulse OFF) cycles for DC and AC NBTI stress. The model converts ΔN<sub>IT</sub> (trap density) to compute the ΔV<sub>IT</sub> (voltage shift) subcomponent of overall ΔV<sub>T</sub>; time evolution of ΔN<sub>IT</sub> is obtained using numerical RD simulation for multi-cycle DC and low f AC, and a calibrated compact model for high f… CONTINUE READING
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